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Anotace knihy

Linac Transmission Electron Microscope, Volume 229 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. Provides the authority and expertise of leading contributors from an international board of authorsPresents the latest release in the Advances in Imaging and Electron Physics series

Parametry knihy

Zařazení knihy Knihy v angličtině Computing & information technology Computer science Signal processing

• Plný název: Linac Transmission Electron Microscope
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 232
• EAN: 9780443296482
• ISBN: 0443296480
• ID: 44517591
• Rozměry: 229 × 152 mm
• Datum vydání: 01. April 2024

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