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Anotace knihy

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ( become hot ), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.§

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Hot Carrier Degradation in Semiconductor Devices
• Autor: Tibor Grasser
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 517
• EAN: 9783319089935
• ISBN: 3319089935
• ID: 02779859
• Nakladatelství: Springer International Publishing AG
• Hmotnost: 940 g
• Rozměry: 165 × 234 × 34 mm
• Datum vydání: 30. October 2014

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