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Anotace knihy

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Hot Carrier Degradation in Semiconductor Devices
• Autor: Tibor Grasser
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 517
• EAN: 9783319359120
• ISBN: 3319359126
• ID: 15193572
• Nakladatelství: Springer International Publishing AG
• Hmotnost: 8859 g
• Rozměry: 235 × 155 × 21 mm
• Datum vydání: 24. September 2016

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