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Anotace knihy

This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Classical mechanics

• Plný název: Low-Frequency Noise in Advanced MOS Devices
• Autor: Martin von Haartman, Mikael Östling
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 216
• EAN: 9789048174720
• ISBN: 9048174724
• ID: 01975631
• Nakladatelství: Springer
• Hmotnost: 361 g
• Rozměry: 235 × 155 × 13 mm
• Datum vydání: 25. November 2010

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