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Více informací o knize Reliability and Failure of Electronic Materials and Devices

• Parametry knihy
• Anotace
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Anotace knihy

This well-established and well-regarded reference work offers unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage. This new edition will add cutting edge knowledge gained in both research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Reliability and Failure of Electronic Materials and Devices
• Autor: Ohring
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 758
• EAN: 9780120885749
• ISBN: 0120885743
• ID: 04020576
• Nakladatelství: Elsevier Books
• Hmotnost: 1224 g
• Rozměry: 232 × 165 × 46 mm
• Datum vydání: 23. October 2014

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